Abstract / scope
ISO 15470:2004 describes the way in which specific aspects of the performance of an X-ray photoelectron spectrometer shall be described.
ISO 15470:2004Withdrawn
Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters
Analyse chimique des surfaces — Spectroscopie de photoélectrons X — Description de certains paramètres relatifs à la performance instrumentale
This edition has been replaced by ISO 15470:2017.