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ISO 16243:2011Published

Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

Analyse chimique des surfaces — Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)

Abstract / scope

ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.