ISO 9455-17:2002Withdrawn

Soft soldering fluxes — Test methods — Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues

Flux de brasage tendre — Méthodes d'essai — Partie 17: Essai au peigne et essai de migration électrochimique de résistance d'isolement de surface des résidus de flux

This edition has been replaced by ISO 9455-17:2024.

Abstract / scope

ISO 9455-17:2002 specifies a method of testing for deleterious effects that may arise from flux residues after soldering or tinning test coupons. The test is applicable to type 1 and type 2 fluxes in solid or liquid form, or in the form of flux-cored solder wire, solder preforms or solder paste constituted with eutectic or near-eutectic tin/lead solders.

This test method is also applicable to fluxes for use with lead-free solders. However, the soldering temperatures may be adjusted with agreement between tester and customer.

Life cycle

Replaced by

ISO/PWI 9455-17Deleted (project abandoned)Soft soldering fluxes — Test methods — Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residuesInternational Standard · ISO/TC 44/SC 12ISO 9455-17:2024PublishedSoft soldering fluxes — Test methods — Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residuesInternational Standard · Published 10 Jan 2024 · ISO/TC 44/SC 12