ISO 6442:2005Published

Door leaves — General and local flatness — Measurement method

Vantaux de portes — Planéités générale et locale — Méthode de mesure

Abstract / scope

ISO 6442:2005 can be applied to all rectangular door leaves.

ISO 6442:2005 specifies the method to be used to measure the deviations in general and local flatness of door leaves.

In ISO 6442:2005, the concept of local flatness deviation is limited to defects considered to be prejudicial to the appearance of the door leaf.

Life cycle

Replaces

ISO 6442:1981WithdrawnDoor leaves — Measurement of defects of general flatnessInternational Standard · Published 1 Jan 1981 · ISO/TC 162