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ISO/IEC 10373-6:2011Withdrawn

Identification cards — Test methods — Part 6: Proximity cards

Cartes d'identification — Méthodes d'essai — Partie 6: Cartes de proximité

Abstract / scope

ISO/IEC 10373 defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications.

ISO/IEC 10373-6:2011 defines test methods which are specific to proximity cards and objects, and proximity coupling devices defined in ISO/IEC 14443-1:2008, ISO/IEC 14443-2:2010, ISO/IEC 14443-3:2011 and ISO/IEC 14443-4:2008. ISO/IEC 10373-1 defines test methods which are common to one or more integrated circuit card technologies and other parts deal with other technology-specific tests.

Life cycle

Amendments & corrigenda

ISO/IEC 10373-6:2011/Amd 1:2012WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classesInternational Standard · Published 19 Apr 2012 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2011/Amd 3:2012WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2International Standard · Published 24 Jul 2012 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2011/Amd 2:2012WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbanceInternational Standard · Published 9 Oct 2012 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2011/Amd 4:2012WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytesInternational Standard · Published 5 Dec 2012 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2011/Cor 1:2013WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Technical Corrigendum 1: R2 value range, start of PICC transmission and program for EMD level measurementInternational Standard · Published 30 Aug 2013 · ISO/IEC JTC 1/SC 17

Replaces

ISO/IEC 10373-6:2001WithdrawnIdentification cards — Test methods — Part 6: Proximity cardsInternational Standard · Published 31 May 2001 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2001/Amd 2:2003WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methodsInternational Standard · Published 10 Oct 2003 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2001/Amd 4:2006WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposureInternational Standard · Published 14 Jun 2006 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2001/Amd 3:2006WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devicesInternational Standard · Published 5 Oct 2006 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2001/Amd 1:2007WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 1: Protocol test methods for proximity cardsInternational Standard · Published 30 Mar 2007 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2001/Amd 5:2007WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16International Standard · Published 11 Oct 2007 · ISO/IEC JTC 1/SC 17 ISO/IEC 10373-6:2001/Amd 7:2010WithdrawnIdentification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassportInternational Standard · Published 10 Mar 2010 · ISO/IEC JTC 1/SC 17

Replaced by

ISO/IEC 10373-6:2016WithdrawnIdentification cards — Test methods — Part 6: Proximity cardsInternational Standard · Published 18 Jul 2016 · ISO/IEC JTC 1/SC 17