Abstract / scope
ISO 19840:2012 specifies a procedure for the verification of dry-film thickness against nominal dry-film thickness on rough surfaces, including the adjustment of the instruments used, the definition of inspection areas, sampling plans, measurement methods and acceptance/rejection criteria.
The procedure is based on the use of instruments of the permanent magnet, electromagnet and eddy current type. Instrument accuracy is verified both at zero and at a known thickness on a smooth surface and adjusted if necessary.
It does not apply to nominal dry-film thicknesses less than 40 µm.