ISO/TS 25138:2019Withdrawn

Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry

Analyse chimique des surfaces — Analyse de films d'oxyde de métal par spectrométrie d'émission optique à décharge luminescente

This edition has been replaced by ISO/TS 25138:2025.

Abstract / scope

This document describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films.

This method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn, Zr and Al. Other elements that can be determined by the method are O, C, N, H, P and S.

Life cycle

Replaces

ISO/TS 25138:2010WithdrawnSurface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometryTechnical Specification · Published 22 Nov 2010 · ISO/TC 201/SC 8

Replaced by

ISO/TS 25138:2025PublishedSurface chemical analysis — Analysis of metal oxide films by glow discharge optical emission spectrometryTechnical Specification · Published 20 Feb 2025 · ISO/TC 201/SC 8