+91 80984 42953 hello@sascert.in
Verify a certificate ISO standards library Download brochure
ISO 23729:2022Published

Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

Analyse chimique des surfaces — Microscopie à force atomique — Lignes directrices relatives au mode opératoire de restauration des images de microscopie à force atomique dilatées par la taille finie de la sonde

Abstract / scope

This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.