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ISO/DTS 23879Under development

Nanotechnologies — Structural characterization of graphene oxide flakes — Thickness and lateral size measurement using atomic force microscopy and scanning electron microscopy

Nanotechnologies — Caractérisation structurale des feuillets d'oxyde de graphène — Mesure de l'épaisseur et de la taille latérale par microscopie à force atomique et microscopie électronique à balayage

Abstract / scope

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.