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ISO 14133-1:2006WithdrawnOptics and optical instruments — Specifications for binoculars, monoculars and spotting scopes — Part 1: General purpose instrumentsInternational Standard · Published 15 Mar 2006 · ISO/TC 172/SC 4ISO 14133-2:2006WithdrawnOptics and optical instruments — Specifications for binoculars, monoculars and spotting scopes — Part 2: High performance instrumentsInternational Standard · Published 15 Mar 2006 · ISO/TC 172/SC 4ISO 14135-1:2017WithdrawnOptics and photonics — Specifications for telescopic sights — Part 1: General-purpose instrumentsInternational Standard · Published 31 Jul 2017 · ISO/TC 172/SC 4ISO 14135-2:2017WithdrawnOptics and photonics — Specifications for telescopic sights — Part 2: High-performance instrumentsInternational Standard · Published 31 Jul 2017 · ISO/TC 172/SC 4ISO 14135-1:2014WithdrawnOptics and photonics — Specifications for telescopic sights — Part 1: General-purpose instrumentsInternational Standard · Published 18 Sep 2014 · ISO/TC 172/SC 4ISO 14135-2:2014WithdrawnOptics and photonics — Specifications for telescopic sights — Part 2: High-performance instrumentsInternational Standard · Published 18 Sep 2014 · ISO/TC 172/SC 4ISO 14135-2:2003WithdrawnOptics and optical instruments — Specifications for telescopic sights — Part 2: High-performance instrumentsInternational Standard · Published 3 Dec 2003 · ISO/TC 172/SC 4ISO 14135-1:2003WithdrawnOptics and optical instruments — Specifications for telescopic sights — Part 1: General-purpose instrumentsInternational Standard · Published 3 Dec 2003 · ISO/TC 172/SC 4ISO 14490-5:2017WithdrawnOptics and photonics — Test methods for telescopic systems — Part 5: Test methods for transmittanceInternational Standard · Published 26 Jul 2017 · ISO/TC 172/SC 4ISO 14490-3:2016WithdrawnOptics and photonics — Test methods for telescopic systems — Part 3: Test methods for telescopic sightsInternational Standard · Published 18 Feb 2016 · ISO/TC 172/SC 4ISO 14490-5:2005WithdrawnOptics and optical instruments — Test methods for telescopic systems — Part 5: Test methods for transmittanceInternational Standard · Published 25 Oct 2005 · ISO/TC 172/SC 4ISO 14490-6:2005WithdrawnOptics and optical instruments — Test methods for telescopic systems — Part 6: Test methods for veiling glare indexInternational Standard · Published 21 Oct 2005 · ISO/TC 172/SC 4ISO 14490-7:2005WithdrawnOptics and optical instruments — Test methods for telescopic systems — Part 7: Test methods for limit of resolutionInternational Standard · Published 17 Oct 2005 · ISO/TC 172/SC 4ISO 14490-3:2004WithdrawnOptics and optical instruments — Test methods for telescopic systems — Part 3: Test methods for telescopic sightsInternational Standard · Published 30 Jan 2004 · ISO/TC 172/SC 4ISO 14997:2011WithdrawnOptics and photonics — Test methods for surface imperfections of optical elementsInternational Standard · Published 12 Apr 2011 · ISO/TC 172/SC 1ISO 14997:2003WithdrawnOptics and optical instruments — Test methods for surface imperfections of optical elementsInternational Standard · Published 28 Apr 2003 · ISO/TC 172/SC 1ISO 14999-4:2015WithdrawnOptics and photonics — Interferometric measurement of optical elements and optical systems — Part 4: Interpretation and evaluation of tolerances specified in ISO 10110International Standard · Published 23 Jul 2015 · ISO/TC 172/SC 1ISO 14999-4:2007WithdrawnOptics and photonics — Interferometric measurement of optical elements and optical systems — Part 4: Interpretation and evaluation of tolerances specified in ISO 10110International Standard · Published 10 Jul 2007 · ISO/TC 172/SC 1ISO/TR 14999-2:2005WithdrawnOptics and photonics — Interferometric measurement of optical elements and optical systems — Part 2: Measurement and evaluation techniquesTechnical Report · Published 16 Mar 2005 · ISO/TC 172/SC 1ISO 15362:1998WithdrawnOptics and optical instruments — Stereomicroscopes — Information provided to the userInternational Standard · Published 2 Jul 1998 · ISO/TC 172/SC 5ISO 15632:2002WithdrawnMicrobeam analysis — Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectorsInternational Standard · Published 25 Nov 2002 · ISO/TC 202ISO 16700:2004WithdrawnMicrobeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnificationInternational Standard · Published 5 Mar 2004 · ISO/TC 202/SC 4ISO 17328:2014WithdrawnOptics and photonics — Optical materials and components — Test method for refractive index of infrared optical materialsInternational Standard · Published 20 Oct 2014 · ISO/TC 172/SC 3ISO 17411:2014WithdrawnOptics and photonics — Optical materials and components — Test method for homogeneity of optical glasses by laser interferometryInternational Standard · Published 19 May 2014 · ISO/TC 172/SC 3ISO 18221:2016WithdrawnMicroscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performanceInternational Standard · Published 29 Jun 2016 · ISO/TC 172/SC 5