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ISO 13067:2011WithdrawnMicrobeam analysis — Electron backscatter diffraction — Measurement of average grain sizeISO 14594:2014WithdrawnMicrobeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopyISO 14594:2003WithdrawnMicrobeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopyISO 16592:2006WithdrawnMicrobeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve methodISO 19214:2017WithdrawnMicrobeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopyISO 20263:2017WithdrawnMicrobeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materialsISO 24173:2009WithdrawnMicrobeam analysis — Guidelines for orientation measurement using electron backscatter diffractionISO 25498:2018WithdrawnMicrobeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscopeISO 25498:2010WithdrawnMicrobeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope