Abstract / scope
The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.
ISO 6342:1993Withdrawn
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Micrographie — Cartes à fenêtre — Méthode de mesurage de la zone de surépaisseur
This edition has been replaced by ISO 6342:2003.