Abstract / scope
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
ISO 6342:2003Published
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Micrographie — Cartes à fenêtre — Méthode de mesurage de la zone de surépaisseur