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ISO 18118:2004Withdrawn

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Analyse chimique des surfaces — Spectroscopie des électrons Auger et spectroscopie de photoélectrons — Lignes directrices pour l'utilisation de facteurs expérimentaux de sensibilité relative pour l'analyse quantitative de matériaux homogènes

Abstract / scope

ISO 18118:2004 gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.

Life cycle

Replaced by

ISO 18118:2015WithdrawnSurface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materialsInternational Standard · Published 8 Apr 2015 · ISO/TC 201/SC 7