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ISO 19012-1:2011WithdrawnMicroscopes — Designation of microscope objectives — Part 1: Flatness of field/PlanISO 19012-2:2009WithdrawnOptics and photonics — Designation of microscope objectives — Part 2: Chromatic correctionISO 19012-1:2007WithdrawnOptics and photonics — Designation of microscope objectives — Part 1: Flatness of field/PlanISO 19741:2018WithdrawnOptics and photonics — Optical materials and components — Test method for striae in infrared optical materialsISO 20263:2017WithdrawnMicrobeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materialsISO 21575:2018WithdrawnOptics and photonics — Optical materials and components — The powder test method for the water resistance of optical glassISO 22493:2008WithdrawnMicrobeam analysis — Scanning electron microscopy — VocabularyISO 25297-1:2010WithdrawnOptics and photonics — Electronic exchange of optical data — Part 1: NODIF information modelISO 29301:2017WithdrawnMicrobeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structuresISO 29301:2010WithdrawnMicrobeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures