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ISO 18115-2:2021PublishedSurface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopyISO 18118:2024PublishedSurface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materialsISO 18337:2015PublishedSurface chemical analysis — Surface characterization — Measurement of the lateral resolution of a confocal fluorescence microscopeISO/TR 18392:2005PublishedSurface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgroundsISO/TR 18394:2016PublishedSurface chemical analysis — Auger electron spectroscopy — Derivation of chemical informationISO/TS 18507:2015PublishedSurface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysisISO 18516:2019PublishedSurface chemical analysis — Determination of lateral resolution and sharpness in beam based methods with a range from nanometres to micrometresISO 18554:2016PublishedSurface chemical analysis — Electron spectroscopies — Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopyISO 19229:2019PublishedGas analysis — Purity analysis and the treatment of purity dataISO 19230:2020PublishedGas analysis — Sampling guidelinesISO 19318:2021PublishedSurface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correctionISO/TR 19319:2013PublishedSurface chemical analysis — Fundamental approaches to determination of lateral resolution and sharpness in beam-based methodsISO 19668:2017PublishedSurface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materialsISO/TR 19693:2018PublishedSurface chemical analysis — Characterization of functional glass substrates for biosensing applicationsISO 19830:2015PublishedSurface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopyISO 20289:2025PublishedSurface chemical analysis — Total reflection X-ray fluorescence analysis of waterISO 20341:2003PublishedSurface chemical analysis — Secondary-ion mass spectrometry — Method for estimating depth resolution parameters with multiple delta-layer reference materialsISO 20411:2018PublishedSurface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometryISO 20579-2:2025PublishedSurface chemical analysis — Sample handling, preparation and mounting — Part 2: Documenting and reporting the preparation and mounting of specimens for analysisISO 20579-1:2024PublishedSurface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysisISO 20579-3:2021PublishedSurface chemical analysis — Sample handling, preparation and mounting — Part 3: BiomaterialsISO 20579-4:2018PublishedSurface chemical analysis — Guidelines to sample handling, preparation and mounting — Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysisISO 20903:2019PublishedSurface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting resultsISO 21079-1:2008PublishedChemical analysis of refractories containing alumina, zirconia and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 1: Apparatus, reagents and dissolutionISO 21079-2:2008PublishedChemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 2: Wet chemical analysis