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ISO 17862:2013WithdrawnSurface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysersISO 17973:2016WithdrawnSurface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysisISO 17973:2002WithdrawnSurface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysisISO 18114:2003WithdrawnSurface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materialsISO 18115-1:2013WithdrawnSurface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopyISO 18115-2:2013WithdrawnSurface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopyISO 18115-1:2010WithdrawnSurface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopyISO 18115-2:2010WithdrawnSurface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopyISO 18115:2001WithdrawnSurface chemical analysis — VocabularyISO 18116:2005WithdrawnSurface chemical analysis — Guidelines for preparation and mounting of specimens for analysisISO 18117:2009WithdrawnSurface chemical analysis — Handling of specimens prior to analysisISO 18118:2015WithdrawnSurface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materialsISO 18118:2004WithdrawnSurface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materialsISO/TR 18394:2006WithdrawnSurface chemical analysis — Auger electron spectroscopy — Derivation of chemical informationISO 18516:2006WithdrawnSurface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Determination of lateral resolutionISO 19229:2015WithdrawnGas analysis — Purity analysis and the treatment of purity dataISO 19318:2004WithdrawnSurface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correctionISO/TR 19319:2003WithdrawnSurface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Determination of lateral resolution, analysis area, and sample area viewed by the analyserISO 20289:2018WithdrawnSurface chemical analysis — Total reflection X-ray fluorescence analysis of waterISO 20903:2011WithdrawnSurface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting resultsISO 20903:2006WithdrawnSurface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting resultsISO/TS 25138:2019WithdrawnSurface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometryISO/TS 25138:2010WithdrawnSurface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry